One-Stop IDM Chip Supplier
Covering the full process chain — chip design, MOCVD epitaxy, photolithography, cleaving & coating,
packaging, testing, and high-volume production.
Wafer
2/3inches optional
InP/GaN/GaAs Materials Optional
Laser Type:DFB,VCSEL,FP,SLD,DBR
Bare Chip
Different Cavity Length
High Speed Modulated
Narrow Linewidth
Chip On Carrier
TE polarization
Carrier Size Optional
Reliable and Low cost
Laser Diode
Diversified packaging.
Different power options
Full Performances tested
Laser System
Expand customer-defined functions
Customize According to Request
LD-PD makes chips closer to applications
We know how to change this.


ACCURATE WAVELENGTH SCREENING
LD-PD can perform wavelength screening on COC chips, providing photon chips with a tolerance better than ± 1nm. LD-PD has a near-infrared high-speed acquisition wavelength meter, and a mid infrared FTIR Fourier spectrometer for strict screening of all wavelengths
AUTOMATIC POWER MONITORING
The fully automatic L-I-V curve detection system independently developed by LD-PD greatly improves the efficiency of semiconductor laser testing. It automatically measures the relationship between laser power and driving voltage with current changes, and draws relevant curves in real time
PRECISION SPECTRAL ANALYSIS
Anritsu MS9740B Spectral Analyzer covers 600-1750nm, 0.07nm resolution, dynamic range 70dB, AQ6375E mid infrared spectrometer 1000-2500nm resolution, 0.05nm dynamic range 50dB
CHARACTERIZATION OF BEAM QUALITY
Beam quality is an important aspect of laser beam characterization. LD-PD analyzes the 2D/3D profile of the laser beam, evaluates M2, and analyzes the beam quality of the laser
FREE ASSEMBLY DRIVE
Users can customize pins, compatible with any pin definition; Can be assembled after welding to improve product reliability; Ultra low noise circuit design meets the requirements of narrow linewidth and low noise in the sensing field