Products

LD-PD can perform wavelength screening on COC chips, providing photon chips with a tolerance better than ± 1nm. LD-PD has a near-infrared high-speed acquisition wavelength meter, and a mid infrared FTIR Fourier spectrometer for strict screening of all wavelengths

The fully automatic L-I-V curve detection system independently developed by LD-PD greatly improves the efficiency of semiconductor laser testing. It automatically measures the relationship between laser power and driving voltage with current changes, and draws relevant curves in real time

Anritsu MS9740B Spectral Analyzer covers 600-1750nm, 0.07nm resolution, dynamic range 70dB, AQ6375E mid infrared spectrometer 1000-2500nm resolution, 0.05nm dynamic range 50dB

Beam quality is an important aspect of laser beam characterization. LD-PD analyzes the 2D/3D profile of the laser beam, evaluates M2, and analyzes the beam quality of the laser