The laser is a semiconductor InGaAsP DFB laser working at the 1625nm, 1648.2nm, 1650.9nm or 1653.7 nm wavelength range. The device can be delivered in chip forms. This high performance, and high reliability laser is suitable for gas detection application.
Name | Model | Description | Parameter | Price |
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● Wide temperature range available
● High Reliability
● Multi-quantum Well (MQW) active layer
Electrical/Optical Characteristics (Tsub=25°C, CW bias unless stated otherwise)
Parameter | Symbol | Min | Typ | Max | Unit |
Centre Wavelength | λ | 1625 1648.2 1650.9 1653.7nm | |||
Side Mode Suppression Ratio | SMSR | 30 | 40 | dB | |
Threshold Current | Ith | 5 | 10 | mA | |
Operating Current | Iop | 80 | 120 | mA | |
Chip output Power | Pf | 5.5 | 10 | 30 | mW |
Quantum Efficiency | η | 0.08 | 0.12 | mW/mA | |
Current Tuning Coefficient | ∆λ/∆I | 0.015 | nm/mA | ||
Temperature Tuning Coefficient | ∆λ/∆T | 0.12 | nm/K | ||
Forward Voltage | Vf | 1.3 | 2 | V | |
Kink deviation | KINK | 30% | |||
Beam divergence angle (parallel) | ϑ// | 25 | Deg | ||
Beam Divergence angle (perpendicular) | ϑ⊥ | 35 | Deg | ||
Resistance | Rs | 8 | ohm | ||
20dB width | △λ | 1 | nm |
Outline Drawing
Note: The silk screen on the pictures is only for reference .
Absolute maximum ratings
Item | Unit | Min | Typ | Max |
Case Temperature | ℃ | -5 | 25 | 70 |
Chip Temperature | ℃ | +10 | 25 | 50 |
Operating Current | mA | 0 | 80 | 100 |
Forward Voltage | V | 0.8 | 1.2 | 2.0 |
Suggest TEC Current | A | - | - | 1.2 |
Reverse Voltage(LD) | V | - | - | 2.0 |
Reverse Voltage(PD) | V | - | - | 20 |
Note:
1.Stresses which exceed the absolute maximum ratings can cause permanent damage to the device.
2.These are only absolute stress ratings . Functional operation of the device is not implied at conditions exceeding those given in the operational sections of the data sheet.
3.Exposure to absolute maximum ratings for extended periods can affect device reliability adversely
Handling Procedures
1. Suggested bonding condition
● Bonding temperature: 350℃
● Bonding force: 30 grams (not exceed 40 grams)
● Bonding force and temperature should be applied in a gradual fashion
● Bonding time: <= 10 seconds
2. Suggested burn-in conditions
Conditions 1:
● Chip heatsink temperature: 100℃
● Current: 100mA
● Time: 24 hours
● Pass Criteria: BI 0hrs LIV1;BI 24hrs LIV2 Compare LIV2 to LIV1
● Delta Ith (T=25℃) ≤1mA and Delta Pf(T=25℃) ≤10%
Conditions 2:
● Chip heatsink temperature: 100℃
● Current: 100mA
● Time: 24 hours+48hrs
● Pass Criteria: BI 24hrs LIV1;BI 24hrs+48hrs LIV2 Compare LIV2 to LIV1
● Delta Ith (T=25℃) ≤0.7mA and Delta Pf(T=25℃) ≤5%
● Tunable diode laser absorption spectroscopy
● CH4 Monitoring
TDLAS-DFB Chips-☆-A8▽-W□□□□
☆ :Output Power
A:5.5mW
B:20mW
▽:Wavelength Tolerance
1:±1nm
2:±2nm
□□□□:Wavelength
1625:1625nm
*****
1653.7:1653.7nm