1550nm High Power Gain Chip     


Gain chips are semiconductor optical elements used as the optical gain medium of external cavity laser diodes. Gain chips are used as a TLS (Tunable Light Source) that can change the oscillation wavelength using a wavelength selection filter such as a diffraction grating.



Product model


Name Model Price
1550nm High Power Gain Chip   [PDF]  [RFQ]

HP-GC-1550-1
Stock NO.: I80040006
[Please inquire]


Parameter



Features

● AlGaInAs MQW(Multiple Quantum Well)             

● Broad tuning range

● High output power

● Edge-emitting

● Low facet reflectivity

●  C band coverage

E/O Characteristics

Electro-Optical Characteristics

Characteristics of RSOA chip:

Parameter

Symbol

Test Conditions

Min.

Typ.

Max.

Unit

Beam Exit Angle

Θext

Tc=25&CW I=200mA

--

19.5

--

Optical Output Power

P

Tc=25&CW I=200mA

5

15

--

mW

Series Resistance

Rs

Tc=25&CW I=200mA

--

2

4

Ohm

Forward Voltage

V

Tc=25&CW I=200mA


1.3

2

V

Center wavelength

λ

Tc=25℃&CW I=200mA

--

1540

--

nm

ASE bandwidth

Δλ

Tc=25℃&CW I=200mA@-3dB

40

50

--

nm

 

Angled Facet Reflectivity

R1

--

--

0.01

--

%

R2

--

--

90

--

%

Length

L

--

--

1000

--

μm

Farfield (Vertical)

θ v

Tc=25&CW I=200mA@R1

--

19

--

Farfield (Horizontal)

θ h

Tc=25℃&CW I=200mA@R1

--

13

--


Characteristics based on little external cavity reflectivity at 1550nm:

Parameter

Symbol

Test Conditions

Min.

Typ.

Max.

Unit

Threshold Current

Ith

Tc=25&CW

--

20

40

mA

Wavelength Range

λp

Tc=25℃&CW

--

1550

--

nm

Optical Output Power

P

Tc=25&CW I=200mA

20

40

--

mW

Series Resistance

Rs

Tc=25&CW I=200mA

--

2

4

Ohm

Side Mode Suppression Ratio

SMSR

Tc=25℃&CW I=200mA

--

50

--

dB

Forward Voltage

V

Tc=25&CW I=200mA


1.3

2

V


Typical Performance of RSOA Chip:



t2.png

Absolute maximum ratings*:

Parameter

Symbol

Min.

Max.

Unit

Operating Temperature

To

-5

85

Storage Temperature

Ts

-40

100

Forward current

If

--

500

mA

Reverse Voltage

VR

--

2

V

ESD(HBM)

ESD

--

500

V

*Stresses in excess of the absolute maximum ratings can cause permanent damage to the device. These are absolute stress ratings only. Functional operation of the device is not implied at these or any other conditions in excess of those given in the operational sections of the data sheet. Exposure to absolute maximum ratings for extended periods can adversely affect device reliability.

**These maximum stresses are to be applied only after the chip is properly bonded to a heat sink. Applying current to a bare chip can damage the device.


Outline Diagram and Die Dimensions

 Chip appearance and size (unit: mm): 

t3.png

Chip Dimensions (w*l*h) = 300±10μm*1000±20μm*100±10μm


ESD and EOS:

Switching transients can cause electrical overstress (EOS) damage in a chip.

EOS may result from improper ESD handling, improper power sequencing, a faulty power supply or an intermittent connection.

Proper turn-on sequence: 

a.All ground connections   

b. Most negative supply

c. Most positive supply

d. All remaining connections Reverse order to turn-off.


Laser Safety:

Caution: Use of controls, adjustments and procedure other than those specified herein may result in hazardous laser radiation exposure.

20240625212009.png



Application

● Gain medium for widely tunable external cavity semiconductor lasers

● Gain medium for narrow linewidth lasers



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