This product is an 850 nm 100 Gb/s InGaAs 1×4 array photodetector chip that performs photoelectric conversion. It is suitable for applications such as multimode transceivers and optical receivers.
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● Large photosensitive area
● Low capacitance
● Low dark current
● High responsivity
Unless otherwise specified, measurements are taken at 25°C
Parameter | Symbol | Test Condition | Min. | Typ. | Max. | Unit |
Operating Temperature | To | 0 | 75 | °C | ||
Storage Temperature | Ts | -40 | 85 | °C | ||
Operating Wavelength | λ | 850 | nm | |||
Bias Voltage | Vb | 3 | 6 | V | ||
Active Area Diameter | Φ | 32 | μm | |||
Responsivity | R | λ = 1550 nm, Vb = 3 V | 0.6 | A/W | ||
Dark Current | Id | Vb = 3 V | 0.1 | 1 | nA | |
Capacitance | C | Vb= 3 V | 100 | fF | ||
Series Resistance | Rs | 10 | Ω | |||
3 dB Bandwidth (15 Ω TIA) | BW | Ps, o= 0 dBm, Vb = 3 V | 32 | GHz |

Appearance | Min. Value | Typical Value | Max. Value | Unit |
Length | 1050 | 1100 | 1150 | μm |
Width | 240 | 290 | 340 | μm |
Thickness | 185 | 200 | 215 | μm |
Precautions for Use
● Necessary ESD protection measures should be taken to prevent the chip from electrostatic damage.
● Extreme care is required when handling the chip, and vacuum suction is recommended for chip handling.
● Parameters such as wire bonding force and temperature must be set carefully to avoid damaging the chip.