Response wavelength 1000-1650nm, Material InGaAs, Effective pixel diameter 25μm
Part Number : SPD65111S |
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The SPD65111S is a InGaAs Unit Single-Photon Detector Module,Operating wavelength 1.0μm~1.65μm ,High detection sensitivity (single-photon level detection capability),Free-running mode (adjustable operating gate width), LVTTL/TTL output, Capable of internal and external synchronous operation, Adjustable key setting parameters, Optional free-space light/FC pluggable optical interface/multi-mode fiber (62.5μm).
Characteristic parameters | Sign | Test conditions | Min. | Typ. | Max. | Unit |
Detector Specifications and Configuration Parameters | ||||||
Effective pixel diameter | d | — | — | 25 | — | μm |
Operating wavelength | λ | — | 1000 | — | 1650 | nm |
Output signal amplitude | Vout | 2.5 | 3.3 | 5.0 | V | |
Power consumption | PDC | VIN =12.0V,Tth=-30℃±5℃ | — | 15.0 | — | W |
Input voltage | VIN | — | — | 12 | — | V |
Input current | IIN | VIN =12.0V,Tth=-30℃±5℃ | 1.5 | — | A | |
Operating ambient temperature | TA | — | -40 | — | 55 | ℃ |
Weight | Wt | — | — | — | 300 | g |
Detector size | SC | — | 89 ×62 ×30 | mm | ||
Performance Parameter | ||||||
Photon Detection Efficiency | PDE |
TA=25±5℃,Tth=-30℃±5℃, τ=0.8 μs±0.1 μs,λ=1550±50nm(InGaAs),λ=1064±10nm(InGaAsP) | 10 | 15 | — | % |
Dark Count Rate (InGaAs) | DCR(PDE=10%) |
— |
— |
10 |
kHz | |
Dark Count Rate (InGaAsP) | DCR(PDE=10%) | — | — | 5 | kHz | |
After pulse Probability | APP(PDE=10%) | — | — | 20 | % | |
Tth: InGaAs avalanche photodiode chip operating temperature. τ: Dead time. Ambient temperature for the above parameter tests: TA = 25 ± 5℃. |
Parameter Setting Range and Recommended Operating Conditions
No. | Parameters | Rated Values | |
Parameter Setting Range | 1 | Detector operating temperature | -30℃~30℃, minimum step value: 0.1℃ |
2 | Dead time adjustment | 0.1μs~2.0μs, step value: 0.025μs | |
3 | Avalanche voltage threshold adjustment | 50.0V~85.0V, step value: 0.1V | |
4 | Geiger avalanche comparison voltage setting | 0.35V~1.10V, step value: 0.01V | |
5 | Detector operating gate width and operating cycle adjustment | Operating gate width: ≥0.1μs; operating cycle: >0.1μs; step value: 0.01μs | |
No. | Parameters | Rated Values | |
Recommended Operating Conditions | 1 | Detector operating temperature | -30℃~0℃ |
2 | Dead time value | 0.80μs | |
3 | Avalanche voltage threshold adjustment | See the test report for details | |
4 | Geiger avalanche comparison voltage setting | 0.45V~0.90V |
Typical Characteristic Curves
Figure 1 InGaAs Spectral Response Characteristic Curve
Figure 2 InGaAsP Spectral Response Characteristic Curve
Quality Reliability Assurance
Implement the relevant requirements of GJB8121-2013 "General Specifications for Semiconductor Optoelectronic Assemblies"